Applications of Scanning Probe Microscopy

There are a many applications of scanning probe microscopy utilizing the precise distance regulation between tip and sample in order to position a tip in the optical nearfield of a sample. The advantage of the optical nearfield is the one can obtain optical information with a resolution smaller than the wavelength of the used light. Additionaly one can observe amplification effects used for example by tip enhanced raman spectroscopy (TERS).

In this context we developed in close collaboration with the Fritz-Haber-Institut in Berlin, Germany a UHV raman system providing an extraordinarily high numerical aperture:

• A nearly optimal UHV tip enhanced raman spectroscopy system

With a Scanning Probe Microscope you can do much more than record images of surfaces. Here you can read something about optical nearfield microscopy (SNOM) and AFM lithography

• Further applications of Scanning Probe Microscopy

and in this connection, we also have a page with

• Video animations of Optical Nearfield Spectroscopy measurements